Annual IEEE Semiconductor Thermal Measurement and Management Symposium
Conference and proceedings
Country
United States
Northern America
Subject Area and Category
Engineering
└
Electrical and Electronic Engineering
└
Instrumentation
SJR 2025
0.208
SJR Score
H-Index
44
Citations / Doc (2yr)
0.62
Total Docs. (latest)
41
Total Citations (3yr)
23
Publication type
Conference and proceedingss
ISSN
10652221
Coverage
1995-2017, 2023-2025
Journal Rank
#21,464
Subject Categories
Electrical and Electronic Engineering
Instrumentation
Subject Areas
Detailed Metrics
| Total Docs. (latest) | 41 |
| Total Docs. (3 years) | 37 |
| Total Refs. | 304 |
| Total Citations (3 years) | 23 |
| Citable Docs. (3 years) | 33 |
| Citations / Doc. (2 years) | 0.62 |
| Ref. / Doc. | 7.41 |
| % Female | 11.2% |
Metrics Visualization
Latest year data vs 3-year cumulative figures
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