Annual IEEE Semiconductor Thermal Measurement and Management Symposium
Conference and proceedings
Country
United States
Northern America
Subject Area and Category
Engineering
└
Electrical and Electronic Engineering
└
Instrumentation
SJR 2025
0.208
SJR Score
H-Index
44
Citations / Doc (2yr)
0.62
Total Docs. (latest)
41
Total Citations (3yr)
23
Publication type
Conference and proceedingss
ISSN
10652221
Coverage
1995-2017, 2023-2025
Journal Rank
#21,464
Subject Categories
Electrical and Electronic Engineering
Instrumentation
Subject Areas
Detailed Metrics
| Total Docs. (latest) | 41 |
| Total Docs. (3 years) | 37 |
| Total Refs. | 304 |
| Total Citations (3 years) | 23 |
| Citable Docs. (3 years) | 33 |
| Citations / Doc. (2 years) | 0.62 |
| Ref. / Doc. | 7.41 |
| % Female | 11.2% |
Metrics Visualization
Latest year data vs 3-year cumulative figures
Publication & Citation Trend
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Top 10 Most Cited Articles
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Frequently Asked Questions
What is the impact factor of Annual IEEE Semiconductor Thermal Measurement and Management Symposium?
The official Journal Impact Factor (JIF) is published by Clarivate in the Journal Citation Reports (JCR) and is not listed on this page. Based on SCImago data, Annual IEEE Semiconductor Thermal Measurement and Management Symposium has an SJR of 0.208.
What is the SJR and quartile of Annual IEEE Semiconductor Thermal Measurement and Management Symposium?
Annual IEEE Semiconductor Thermal Measurement and Management Symposium has an SJR (SCImago Journal Rank) of 0.208.
What is the H-index of Annual IEEE Semiconductor Thermal Measurement and Management Symposium?
The H-index of Annual IEEE Semiconductor Thermal Measurement and Management Symposium is 44, meaning 44 of its articles have each been cited at least 44 times.
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