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AUTOTESTCON (Proceedings)

Conference and proceedings
Country
United States
Northern America
Subject Area and Category
Computer Science
└ Computer Science Applications
└ Electrical and Electronic Engineering
SJR 2025
0.108
SJR Score
H-Index
26
Citations / Doc (2yr)
0.13
Total Citations (3yr)
5
Publication type
Conference and proceedingss
ISSN
07347510
Coverage
1980-1987, 1989-1991, 1993, 1995-2005, 2007-2015, 2019, 2024
Journal Rank
#29,778
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Subject Categories

Computer Science Applications
Electrical and Electronic Engineering

Detailed Metrics

Total Docs. (3 years) 39
Total Citations (3 years) 5
Citable Docs. (3 years) 36
Citations / Doc. (2 years) 0.13

Metrics Visualization

Latest year data vs 3-year cumulative figures

Publication & Citation Trend

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Top 10 Most Cited Articles

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Frequently Asked Questions

What is the impact factor of AUTOTESTCON (Proceedings)?

The official Journal Impact Factor (JIF) is published by Clarivate in the Journal Citation Reports (JCR) and is not listed on this page. Based on SCImago data, AUTOTESTCON (Proceedings) has an SJR of 0.108.

What is the SJR and quartile of AUTOTESTCON (Proceedings)?

AUTOTESTCON (Proceedings) has an SJR (SCImago Journal Rank) of 0.108.

What is the H-index of AUTOTESTCON (Proceedings)?

The H-index of AUTOTESTCON (Proceedings) is 26, meaning 26 of its articles have each been cited at least 26 times.

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Journal Information

SJR0.108
H Index26
ISSN07347510
PublisherInstitute of Electrical and Electronics Engineers Inc.
CountryUnited States
RegionNorthern America
Coverage1980-1987, 1989-1991, 1993, 1995-2005, 2007-2015, 2019, 2024
Open AccessNo
TypeConference and proceedings
Rank#29,778

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