Index your Journal on RJRIndex - A product by ResearchJournalRank.com Index Now
34,158+ Journals Indexed Journal Suggester  |  Compare Journals
Home AUTOTESTCON (Proceedings)

AUTOTESTCON (Proceedings)

Conference and proceedings
Country
United States
Northern America
Subject Area and Category
Computer Science
Computer Science Applications
Electrical and Electronic Engineering
SJR 2025
0.108
SJR Score
H-Index
26
Citations / Doc (2yr)
0.13
Total Citations (3yr)
5
Publication type
Conference and proceedingss
ISSN
07347510
Coverage
1980-1987, 1989-1991, 1993, 1995-2005, 2007-2015, 2019, 2024
Journal Rank
#29,778

Subject Categories

Computer Science Applications
Electrical and Electronic Engineering

Detailed Metrics

Total Docs. (3 years) 39
Total Citations (3 years) 5
Citable Docs. (3 years) 36
Citations / Doc. (2 years) 0.13

Metrics Visualization

Latest year data vs 3-year cumulative figures

Publication & Citation Trend

Loading trend data from Crossref...

Top 10 Most Cited Articles

Loading articles...

Journal Information

SJR0.108
H Index26
ISSN07347510
PublisherInstitute of Electrical and Electronics Engineers Inc.
CountryUnited States
RegionNorthern America
Coverage1980-1987, 1989-1991, 1993, 1995-2005, 2007-2015, 2019, 2024
Open AccessNo
TypeConference and proceedings
Rank#29,778

Embed This Journal

Add this journal's ranking badge to your website:

<iframe src="https://researchjournalrank.com/widget.php?id=30869" style="border:1px solid #e0e0e0;border-radius:8px;width:100%;max-width:320px;height:200px" frameborder="0"></iframe>
Preview:

Researcher Reviews

Write a Review

No reviews yet for this journal.

Be the first to share your experience!

Share Your Experience

Your review will be published after moderation. Email will not be displayed publicly.