Electronic Device Failure Analysis
Subject Categories
Subject Areas
Detailed Metrics
| Total Docs. (latest) | 20 |
| Total Docs. (3 years) | 94 |
| Total Refs. | 121 |
| Total Citations (3 years) | 18 |
| Citable Docs. (3 years) | 38 |
| Citations / Doc. (2 years) | 0.19 |
| Ref. / Doc. | 6.05 |
| % Female | 9.5% |
Metrics Visualization
Latest year data vs 3-year cumulative figures
Publication & Citation Trend
Top 10 Most Cited Articles
Frequently Asked Questions
What is the impact factor of Electronic Device Failure Analysis?
The official Journal Impact Factor (JIF) is published by Clarivate in the Journal Citation Reports (JCR) and is not listed on this page. Based on SCImago data, Electronic Device Failure Analysis has an SJR of 0.112 and is ranked Q4.
What is the SJR and quartile of Electronic Device Failure Analysis?
Electronic Device Failure Analysis has an SJR (SCImago Journal Rank) of 0.112 and its best quartile is Q4.
What is the H-index of Electronic Device Failure Analysis?
The H-index of Electronic Device Failure Analysis is 7, meaning 7 of its articles have each been cited at least 7 times.
Is Electronic Device Failure Analysis indexed in Scopus?
Yes. Electronic Device Failure Analysis is active in Scopus (Scopus Source List, August 2026).
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