IEEE International Conference on Microelectronic Test Structures
Conference and proceedings
Country
United States
Northern America
Subject Area and Category
Engineering
└
Electrical and Electronic Engineering
SJR 2025
0.227
SJR Score
H-Index
24
Citations / Doc (2yr)
0.50
Total Docs. (latest)
34
Total Citations (3yr)
48
Publication type
Conference and proceedingss
ISSN
10719032, 21581029
Coverage
1988, 1993-2020, 2022-2025
Journal Rank
#20,381
Subject Categories
Electrical and Electronic Engineering
Subject Areas
Detailed Metrics
| Total Docs. (latest) | 34 |
| Total Docs. (3 years) | 103 |
| Total Refs. | 351 |
| Total Citations (3 years) | 48 |
| Citable Docs. (3 years) | 98 |
| Citations / Doc. (2 years) | 0.50 |
| Ref. / Doc. | 10.32 |
| % Female | 18.5% |
Metrics Visualization
Latest year data vs 3-year cumulative figures
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