IEEE International Test Conference (TC)
Conference and proceedings
Country
United States
Northern America
Subject Area and Category
Engineering
└
Applied Mathematics
└
Electrical and Electronic Engineering
SJR 2025
0.580
SJR Score
H-Index
84
Citations / Doc (2yr)
1.29
Total Docs. (latest)
93
Total Citations (3yr)
294
Publication type
Conference and proceedingss
ISSN
10893539
Coverage
1989, 1992, 1995-2013, 2015-2025
Journal Rank
#10,225
Subject Categories
Applied Mathematics
Electrical and Electronic Engineering
Subject Areas
Detailed Metrics
| Total Docs. (latest) | 93 |
| Total Docs. (3 years) | 201 |
| Total Refs. | 1,587 |
| Total Citations (3 years) | 294 |
| Citable Docs. (3 years) | 196 |
| Citations / Doc. (2 years) | 1.29 |
| Ref. / Doc. | 17.06 |
| % Female | 19.5% |
Metrics Visualization
Latest year data vs 3-year cumulative figures
Publication & Citation Trend
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Top 10 Most Cited Articles
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Frequently Asked Questions
What is the impact factor of IEEE International Test Conference (TC)?
The official Journal Impact Factor (JIF) is published by Clarivate in the Journal Citation Reports (JCR) and is not listed on this page. Based on SCImago data, IEEE International Test Conference (TC) has an SJR of 0.580.
What is the SJR and quartile of IEEE International Test Conference (TC)?
IEEE International Test Conference (TC) has an SJR (SCImago Journal Rank) of 0.580.
What is the H-index of IEEE International Test Conference (TC)?
The H-index of IEEE International Test Conference (TC) is 84, meaning 84 of its articles have each been cited at least 84 times.
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