IEEE International Test Conference (TC)
Conference and proceedings
Country
United States
Northern America
Subject Area and Category
Engineering
└
Applied Mathematics
└
Electrical and Electronic Engineering
SJR 2025
0.580
SJR Score
H-Index
84
Citations / Doc (2yr)
1.29
Total Docs. (latest)
93
Total Citations (3yr)
294
Publication type
Conference and proceedingss
ISSN
10893539
Coverage
1989, 1992, 1995-2013, 2015-2025
Journal Rank
#10,225
Subject Categories
Applied Mathematics
Electrical and Electronic Engineering
Subject Areas
Detailed Metrics
| Total Docs. (latest) | 93 |
| Total Docs. (3 years) | 201 |
| Total Refs. | 1,587 |
| Total Citations (3 years) | 294 |
| Citable Docs. (3 years) | 196 |
| Citations / Doc. (2 years) | 1.29 |
| Ref. / Doc. | 17.06 |
| % Female | 19.5% |
Metrics Visualization
Latest year data vs 3-year cumulative figures
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