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Home IEEE Transactions on Device and Materials Reliability

IEEE Transactions on Device and Materials Reliability

Q2 Journal Journal
Country
United States
Northern America
Subject Area and Category
Engineering
Electrical and Electronic Engineering Q2
Safety, Risk, Reliability and Quality Q2
Electronic, Optical and Magnetic Materials Q3
SJR 2025
0.451
Q2
SJR Score
H-Index
85
Citations / Doc (2yr)
2.80
Total Docs. (latest)
140
Total Citations (3yr)
625
Publication type
Journals
ISSN
15582574, 15304388
Coverage
2001-2026
Journal Rank
#12,987

Subject Categories

Electrical and Electronic Engineering Q2
Safety, Risk, Reliability and Quality Q2
Electronic, Optical and Magnetic Materials Q3

Detailed Metrics

Total Docs. (latest) 140
Total Docs. (3 years) 210
Total Refs. 4,505
Total Citations (3 years) 625
Citable Docs. (3 years) 205
Citations / Doc. (2 years) 2.80
Ref. / Doc. 32.18
% Female 26.8%

Metrics Visualization

Latest year data vs 3-year cumulative figures

Publication & Citation Trend

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Journal Information

SJR0.451
Best QuartileQ2
H Index85
ISSN15582574, 15304388
PublisherInstitute of Electrical and Electronics Engineers Inc.
CountryUnited States
RegionNorthern America
Coverage2001-2026
Open AccessNo
TypeJournal
Rank#12,987

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