Microelectronics Reliability
Country
United Kingdom
Western Europe
Subject Area and Category
Engineering
└
Atomic and Molecular Physics, and Optics
Q2
└
Condensed Matter Physics
Q2
└
Electrical and Electronic Engineering
Q2
Publisher
SJR 2025
0.464
Q2
SJR Score
H-Index
115
Citations / Doc (2yr)
2.77
Total Docs. (latest)
298
Total Citations (3yr)
2,207
Publication type
Journals
ISSN
00262714
Coverage
1962-2026
Journal Rank
#12,696
Subject Categories
Atomic and Molecular Physics, and Optics
Q2
Condensed Matter Physics
Q2
Electrical and Electronic Engineering
Q2
Electronic, Optical and Magnetic Materials
Q2
Safety, Risk, Reliability and Quality
Q2
Surfaces, Coatings and Films
Q2
Nanoscience and Nanotechnology
Q3
Subject Areas
Detailed Metrics
| Total Docs. (latest) | 298 |
| Total Docs. (3 years) | 831 |
| Total Refs. | 8,208 |
| Total Citations (3 years) | 2,207 |
| Citable Docs. (3 years) | 826 |
| Citations / Doc. (2 years) | 2.77 |
| Ref. / Doc. | 27.54 |
| % Female | 26.1% |
Metrics Visualization
Latest year data vs 3-year cumulative figures
Publication & Citation Trend
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Top 10 Most Cited Articles
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Frequently Asked Questions
What is the impact factor of Microelectronics Reliability?
The official Journal Impact Factor (JIF) is published by Clarivate in the Journal Citation Reports (JCR) and is not listed on this page. Based on SCImago data, Microelectronics Reliability has an SJR of 0.464 and is ranked Q2.
What is the SJR and quartile of Microelectronics Reliability?
Microelectronics Reliability has an SJR (SCImago Journal Rank) of 0.464 and its best quartile is Q2.
What is the H-index of Microelectronics Reliability?
The H-index of Microelectronics Reliability is 115, meaning 115 of its articles have each been cited at least 115 times.
Is Microelectronics Reliability indexed in Scopus?
Yes. Microelectronics Reliability is active in Scopus (Scopus Source List, August 2026).
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