Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT
Conference and proceedings
Country
United States
Northern America
Subject Area and Category
Computer Science
└
Electrical and Electronic Engineering
└
Hardware and Architecture
└
Safety, Risk, Reliability and Quality
SJR 2025
0.347
SJR Score
H-Index
41
Citations / Doc (2yr)
1.34
Total Docs. (latest)
35
Total Citations (3yr)
173
Publication type
Conference and proceedingss
ISSN
25761501, 2765933X
Coverage
2021-2025
Journal Rank
#15,694
Subject Categories
Electrical and Electronic Engineering
Hardware and Architecture
Safety, Risk, Reliability and Quality
Signal Processing
Subject Areas
Detailed Metrics
| Total Docs. (latest) | 35 |
| Total Docs. (3 years) | 123 |
| Total Refs. | 668 |
| Total Citations (3 years) | 173 |
| Citable Docs. (3 years) | 117 |
| Citations / Doc. (2 years) | 1.34 |
| Ref. / Doc. | 19.09 |
| % Female | 20.0% |
Metrics Visualization
Latest year data vs 3-year cumulative figures
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