Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT
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Detailed Metrics
| Total Docs. (latest) | 35 |
| Total Docs. (3 years) | 123 |
| Total Refs. | 668 |
| Total Citations (3 years) | 173 |
| Citable Docs. (3 years) | 117 |
| Citations / Doc. (2 years) | 1.34 |
| Ref. / Doc. | 19.09 |
| % Female | 20.0% |
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Latest year data vs 3-year cumulative figures
Publication & Citation Trend
Top 10 Most Cited Articles
Frequently Asked Questions
What is the impact factor of Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT?
The official Journal Impact Factor (JIF) is published by Clarivate in the Journal Citation Reports (JCR) and is not listed on this page. Based on SCImago data, Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT has an SJR of 0.347.
What is the SJR and quartile of Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT?
Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT has an SJR (SCImago Journal Rank) of 0.347.
What is the H-index of Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT?
The H-index of Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT is 41, meaning 41 of its articles have each been cited at least 41 times.
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