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Home › Proceedings of SPIE - The International Society for Optical Engineering

Proceedings of SPIE - The International Society for Optical Engineering

Open Access Conference and proceedings
Country
United States
Northern America
Subject Area and Category
Computer Science
└ Applied Mathematics
└ Computer Science Applications
└ Condensed Matter Physics
Publisher
SJR 2025
0.138
SJR Score
H-Index
205
Citations / Doc (2yr)
0.25
Total Docs. (latest)
20,667
Total Citations (3yr)
14,799
Publication type
Conference and proceedingss
ISSN
1996756X, 0277786X
Coverage
1963-2026
Journal Rank
#26,411
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Subject Categories

Applied Mathematics
Computer Science Applications
Condensed Matter Physics
Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials
Instrumentation

Detailed Metrics

Total Docs. (latest) 20,667
Total Docs. (3 years) 60,287
Total Refs. 292,207
Total Citations (3 years) 14,799
Citable Docs. (3 years) 59,074
Citations / Doc. (2 years) 0.25
Ref. / Doc. 14.14
% Female 30.0%

Metrics Visualization

Latest year data vs 3-year cumulative figures

Publication & Citation Trend

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Top 10 Most Cited Articles

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Frequently Asked Questions

What is the impact factor of Proceedings of SPIE - The International Society for Optical Engineering?

The official Journal Impact Factor (JIF) is published by Clarivate in the Journal Citation Reports (JCR) and is not listed on this page. Based on SCImago data, Proceedings of SPIE - The International Society for Optical Engineering has an SJR of 0.138.

What is the SJR and quartile of Proceedings of SPIE - The International Society for Optical Engineering?

Proceedings of SPIE - The International Society for Optical Engineering has an SJR (SCImago Journal Rank) of 0.138.

What is the H-index of Proceedings of SPIE - The International Society for Optical Engineering?

The H-index of Proceedings of SPIE - The International Society for Optical Engineering is 205, meaning 205 of its articles have each been cited at least 205 times.

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Journal Information

SJR0.138
H Index205
ISSN1996756X, 0277786X
PublisherSPIE
CountryUnited States
RegionNorthern America
Coverage1963-2026
Open AccessYes
TypeConference and proceedings
Rank#26,411

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