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Home Proceedings of the Asian Test Symposium

Proceedings of the Asian Test Symposium

Conference and proceedings
Country
United States
Northern America
Subject Area and Category
Engineering
Electrical and Electronic Engineering
SJR 2025
0.180
SJR Score
H-Index
36
Citations / Doc (2yr)
0.55
Total Citations (3yr)
73
Publication type
Conference and proceedingss
ISSN
10817735
Coverage
1993-2016, 2018-2024
Journal Rank
#23,290

Subject Categories

Electrical and Electronic Engineering

Subject Areas

Detailed Metrics

Total Docs. (3 years) 131
Total Citations (3 years) 73
Citable Docs. (3 years) 125
Citations / Doc. (2 years) 0.55

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Journal Information

SJR0.180
H Index36
ISSN10817735
PublisherIEEE Computer Society
CountryUnited States
RegionNorthern America
Coverage1993-2016, 2018-2024
Open AccessNo
TypeConference and proceedings
Rank#23,290

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