Proceedings of the IEEE VLSI Test Symposium
Conference and proceedings
Country
United States
Northern America
Subject Area and Category
Computer Science
└
Computer Science Applications
└
Electrical and Electronic Engineering
Publisher
SJR 2025
0.394
SJR Score
H-Index
61
Citations / Doc (2yr)
1.55
Total Docs. (latest)
59
Total Citations (3yr)
196
Publication type
Conference and proceedingss
ISSN
23751053
Coverage
1991-1992, 1994-2025
Journal Rank
#14,360
Subject Categories
Computer Science Applications
Electrical and Electronic Engineering
Subject Areas
Detailed Metrics
| Total Docs. (latest) | 59 |
| Total Docs. (3 years) | 146 |
| Total Refs. | 1,470 |
| Total Citations (3 years) | 196 |
| Citable Docs. (3 years) | 140 |
| Citations / Doc. (2 years) | 1.55 |
| Ref. / Doc. | 24.92 |
| % Female | 24.2% |
Metrics Visualization
Latest year data vs 3-year cumulative figures
Publication & Citation Trend
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Top 10 Most Cited Articles
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Frequently Asked Questions
What is the impact factor of Proceedings of the IEEE VLSI Test Symposium?
The official Journal Impact Factor (JIF) is published by Clarivate in the Journal Citation Reports (JCR) and is not listed on this page. Based on SCImago data, Proceedings of the IEEE VLSI Test Symposium has an SJR of 0.394.
What is the SJR and quartile of Proceedings of the IEEE VLSI Test Symposium?
Proceedings of the IEEE VLSI Test Symposium has an SJR (SCImago Journal Rank) of 0.394.
What is the H-index of Proceedings of the IEEE VLSI Test Symposium?
The H-index of Proceedings of the IEEE VLSI Test Symposium is 61, meaning 61 of its articles have each been cited at least 61 times.
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