Proceedings of the IEEE VLSI Test Symposium
Conference and proceedings
Country
United States
Northern America
Subject Area and Category
Computer Science
└
Computer Science Applications
└
Electrical and Electronic Engineering
Publisher
SJR 2025
0.394
SJR Score
H-Index
61
Citations / Doc (2yr)
1.55
Total Docs. (latest)
59
Total Citations (3yr)
196
Publication type
Conference and proceedingss
ISSN
23751053
Coverage
1991-1992, 1994-2025
Journal Rank
#14,360
Subject Categories
Computer Science Applications
Electrical and Electronic Engineering
Subject Areas
Detailed Metrics
| Total Docs. (latest) | 59 |
| Total Docs. (3 years) | 146 |
| Total Refs. | 1,470 |
| Total Citations (3 years) | 196 |
| Citable Docs. (3 years) | 140 |
| Citations / Doc. (2 years) | 1.55 |
| Ref. / Doc. | 24.92 |
| % Female | 24.2% |
Metrics Visualization
Latest year data vs 3-year cumulative figures
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