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Home › Proceedings of the Symposium on Design, Test, Integration, and Packaging of MEMS/MOEMS, DTIP

Proceedings of the Symposium on Design, Test, Integration, and Packaging of MEMS/MOEMS, DTIP

Country
United States
Northern America
Subject Area and Category
Engineering
└ Control and Optimization
└ Electrical and Electronic Engineering
└ Electronic, Optical and Magnetic Materials
SJR 2025
N/A
H-Index
1
Total Docs. (latest)
24
Publication type
Journals
ISSN
28368487, 27681874
Coverage
2025
Journal Rank
#32,085
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Subject Categories

Control and Optimization
Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials
Instrumentation
Safety, Risk, Reliability and Quality

Detailed Metrics

Total Docs. (latest) 24
Total Refs. 280
Ref. / Doc. 11.67
% Female 24.5%

Metrics Visualization

Latest year data vs 3-year cumulative figures

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Frequently Asked Questions

What is the impact factor of Proceedings of the Symposium on Design, Test, Integration, and Packaging of MEMS/MOEMS, DTIP?

The official Journal Impact Factor (JIF) is published by Clarivate in the Journal Citation Reports (JCR) and is not listed on this page.

What is the H-index of Proceedings of the Symposium on Design, Test, Integration, and Packaging of MEMS/MOEMS, DTIP?

The H-index of Proceedings of the Symposium on Design, Test, Integration, and Packaging of MEMS/MOEMS, DTIP is 1, meaning 1 of its articles have each been cited at least 1 times.

Is Proceedings of the Symposium on Design, Test, Integration, and Packaging of MEMS/MOEMS, DTIP indexed in Scopus?

Yes. Proceedings of the Symposium on Design, Test, Integration, and Packaging of MEMS/MOEMS, DTIP is active in Scopus (Scopus Source List, August 2026).

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Journal Information

H Index1
ISSN28368487, 27681874
PublisherInstitute of Electrical and Electronics Engineers Inc.
CountryUnited States
RegionNorthern America
Coverage2025
Open AccessNo
TypeJournal
Rank#32,085

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